JPS6364057B2 - - Google Patents
Info
- Publication number
- JPS6364057B2 JPS6364057B2 JP56204070A JP20407081A JPS6364057B2 JP S6364057 B2 JPS6364057 B2 JP S6364057B2 JP 56204070 A JP56204070 A JP 56204070A JP 20407081 A JP20407081 A JP 20407081A JP S6364057 B2 JPS6364057 B2 JP S6364057B2
- Authority
- JP
- Japan
- Prior art keywords
- layer
- thin layer
- semiconductor device
- thin
- tiw
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
- H01L23/532—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body characterised by the materials
- H01L23/53204—Conductive materials
- H01L23/53209—Conductive materials based on metals, e.g. alloys, metal silicides
- H01L23/53214—Conductive materials based on metals, e.g. alloys, metal silicides the principal metal being aluminium
- H01L23/53223—Additional layers associated with aluminium layers, e.g. adhesion, barrier, cladding layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
- H10D62/83—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group IV materials, e.g. B-doped Si or undoped Ge
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D64/00—Electrodes of devices having potential barriers
- H10D64/60—Electrodes characterised by their materials
- H10D64/62—Electrodes ohmically coupled to a semiconductor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Electrodes Of Semiconductors (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56204070A JPS58103168A (ja) | 1981-12-16 | 1981-12-16 | 半導体装置 |
EP82306670A EP0082012B1 (en) | 1981-12-16 | 1982-12-14 | Multilayer electrode of a semiconductor device |
DE8282306670T DE3278146D1 (en) | 1981-12-16 | 1982-12-14 | Multilayer electrode of a semiconductor device |
IE2988/82A IE54310B1 (en) | 1981-12-16 | 1982-12-16 | Multilayer electrode of a semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56204070A JPS58103168A (ja) | 1981-12-16 | 1981-12-16 | 半導体装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS58103168A JPS58103168A (ja) | 1983-06-20 |
JPS6364057B2 true JPS6364057B2 (en]) | 1988-12-09 |
Family
ID=16484261
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56204070A Granted JPS58103168A (ja) | 1981-12-16 | 1981-12-16 | 半導体装置 |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP0082012B1 (en]) |
JP (1) | JPS58103168A (en]) |
DE (1) | DE3278146D1 (en]) |
IE (1) | IE54310B1 (en]) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2164491B (en) * | 1984-09-14 | 1988-04-07 | Stc Plc | Semiconductor devices |
JPH0611076B2 (ja) * | 1985-10-08 | 1994-02-09 | 三菱電機株式会社 | 半導体装置の製造方法 |
DE3776203D1 (de) * | 1986-04-14 | 1992-03-05 | Philips Nv | Halbleiteranordnung mit einer aluminium-verbindungsschicht mit geringem vanadium-prozentgehalt. |
US4796081A (en) * | 1986-05-02 | 1989-01-03 | Advanced Micro Devices, Inc. | Low resistance metal contact for silicon devices |
JPS63148646A (ja) * | 1986-12-12 | 1988-06-21 | Toshiba Corp | 半導体装置 |
US4987562A (en) * | 1987-08-28 | 1991-01-22 | Fujitsu Limited | Semiconductor layer structure having an aluminum-silicon alloy layer |
GB2214709A (en) * | 1988-01-20 | 1989-09-06 | Philips Nv | A method of enabling connection to a substructure forming part of an electronic device |
SG160191A1 (en) | 2001-02-28 | 2010-04-29 | Semiconductor Energy Lab | Semiconductor device and manufacturing method thereof |
JP4926329B2 (ja) | 2001-03-27 | 2012-05-09 | 株式会社半導体エネルギー研究所 | 半導体装置およびその作製方法、電気器具 |
SG116443A1 (en) | 2001-03-27 | 2005-11-28 | Semiconductor Energy Lab | Wiring and method of manufacturing the same, and wiring board and method of manufacturing the same. |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3382568A (en) * | 1965-07-22 | 1968-05-14 | Ibm | Method for providing electrical connections to semiconductor devices |
US3939047A (en) * | 1971-11-15 | 1976-02-17 | Nippon Electric Co., Ltd. | Method for fabricating electrode structure for a semiconductor device having a shallow junction |
US3881971A (en) * | 1972-11-29 | 1975-05-06 | Ibm | Method for fabricating aluminum interconnection metallurgy system for silicon devices |
US3918149A (en) * | 1974-06-28 | 1975-11-11 | Intel Corp | Al/Si metallization process |
JPS5444866A (en) * | 1977-09-16 | 1979-04-09 | Nippon Telegr & Teleph Corp <Ntt> | Semiconductor device |
-
1981
- 1981-12-16 JP JP56204070A patent/JPS58103168A/ja active Granted
-
1982
- 1982-12-14 DE DE8282306670T patent/DE3278146D1/de not_active Expired
- 1982-12-14 EP EP82306670A patent/EP0082012B1/en not_active Expired
- 1982-12-16 IE IE2988/82A patent/IE54310B1/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
IE54310B1 (en) | 1989-08-16 |
JPS58103168A (ja) | 1983-06-20 |
IE822988L (en) | 1983-06-16 |
DE3278146D1 (en) | 1988-03-31 |
EP0082012A3 (en) | 1985-06-05 |
EP0082012A2 (en) | 1983-06-22 |
EP0082012B1 (en) | 1988-02-24 |
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